Nonlinear IV Unit Root Tests in Panels

  • 研討會日期 : 2002-11-26
  • 時間 : 15:00
  • 主講人 : Professor Yoosoon Chang
  • 地點 : B棟110室
  • 演講者簡介 : Prof. Chang為Ph.D. in Economics,Yale University (1995)。 現為Associate Professor,Rice University。
  • 演講摘要 : We suppose a unit root test for panels with cross-sectional dependency. We allow general dependency structure among the innovations that generate data for each of the cross-sectional units. Each unit may have different sample size, and therefore unbalanced panels are also permitted in our framework. Yet, the test is asymptotically normal, and does not require any tabulation of the critical values. Our test is based on nonlinear IV estimation of the usual ADF type regression for each cross-sectional unit, using as instruments nonlinear transformations of the lagged levels. The actual test statistic is simply defined as a standardized sum of individual IV t-ratios. We show in the paper that such a standardized sum of individual IV t-ratios has limit normal distribution as long as the panels have large individual time series observations and are asymptotically balanced in a very weak sense. We may have the number of cross- sectional units arbitrarily small or large. In particular, the usual sequential asymptotics, upon which most of the available asymptotic theories for panel unit root models heavily rely, are not required. Finite sample performance of our test is examined via a set of simulations, and compared to those of other commonly used panel unit root tests. Our test generally performs better than the existing tests in terms of both finite sample sizes and powers. We apply our nonlinear IV method to test for the purchasing power parity hypothesis in panels.